EDAX

Gatan and EDAX have merged. The combined organization will retain the Gatan name, offering the ultimate suite of tools for transmission electron (TEM) and scanning electron (SEM) microscopes.

We are a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS), Electron Backscatter Diffraction (EBSD), and Micro X-ray Fluorescence (µXRF).

The EDAXNews Channel is intended to be a source of informative and educational videos about techniques and resources from our experts.

Достижения в области EBSD для геологических материалов: влияние сферической индексации и эксперим...
Достижения в области EBSD для геологических материалов: влияние сферической индексации и эксперим...
Experience the next level of micro XRF analysis with the EDAX Orbis II
Experience the next level of micro XRF analysis with the EDAX Orbis II
Spherical Index法によるEBSDの進化
Spherical Index法によるEBSDの進化
Getting the most out of your data: Advanced EBSD data processing and reporting in OIM Analysis 9
Getting the most out of your data: Advanced EBSD data processing and reporting in OIM Analysis 9
Unlocking the power of spherical indexing with EDAX OIM Matrix
Unlocking the power of spherical indexing with EDAX OIM Matrix
OIM Matrixによるシミュレーションパターンを用いたEBSDパターンの指数付け
OIM Matrixによるシミュレーションパターンを用いたEBSDパターンの指数付け
球形标定算法解决您纳米晶，大变形等EBSD困难样品的标定困境
球形标定算法解决您纳米晶，大变形等EBSD困难样品的标定困境
EBSD-based correlative microscopy
EBSD-based correlative microscopy
Spherical indexing – See how to improve your EBSD data indexing and results
Spherical indexing – See how to improve your EBSD data indexing and results
Applications of EBSD for analysis of deformed high temperature materials
Applications of EBSD for analysis of deformed high temperature materials
Introduction to electron backscatter diffraction (EBSD)
Introduction to electron backscatter diffraction (EBSD)
Overcoming EBSD indexing challenges using spherical indexing and real space refinement in OIM
Overcoming EBSD indexing challenges using spherical indexing and real space refinement in OIM
The influence of the mode of deformation on recrystallization kinetics in Ni and Ti
The influence of the mode of deformation on recrystallization kinetics in Ni and Ti
APEX 3.0 WDSソフトウェアのご紹介
APEX 3.0 WDSソフトウェアのご紹介
Advances in EDS and EBSD
Advances in EDS and EBSD
Introducing APEX 3 0 Software – now with EDS, EBSD, and WDS
Introducing APEX 3 0 Software – now with EDS, EBSD, and WDS
「OIM - 新時代」OIM-A9 の新機能のご紹介
「OIM - 新時代」OIM-A9 の新機能のご紹介
EDAX Velocity Ultra EBSD Detector
EDAX Velocity Ultra EBSD Detector
Establishing EDS Quantification with Standards as a Technique for Everyday Use with FSQ in APEX
Establishing EDS Quantification with Standards as a Technique for Everyday Use with FSQ in APEX
EDX Quantifizierung mit Standards als alltagstaugliches Verfahren durch FSQ in APEX
EDX Quantifizierung mit Standards als alltagstaugliches Verfahren durch FSQ in APEX
Using EBSD and TKD for New Insights on the Cold Spray Deposition Process
Using EBSD and TKD for New Insights on the Cold Spray Deposition Process
New Tools for EBSD Data Collection and Analysis
New Tools for EBSD Data Collection and Analysis
Current Issues with Data Presentation and Publication
Current Issues with Data Presentation and Publication
Clarity 直接検出型EBSD検出器のご紹介
Clarity 直接検出型EBSD検出器のご紹介
Determining Lithium Content by the Composition by Difference Method
Determining Lithium Content by the Composition by Difference Method
Resolving crystallographically similar phases for more accurate characterization
Resolving crystallographically similar phases for more accurate characterization
OIM Matrix and Forward Modeling
OIM Matrix and Forward Modeling
Developing Clarity – Applications of Direct Detection for Electron Backscatter Diffraction
Developing Clarity – Applications of Direct Detection for Electron Backscatter Diffraction
Comparing 2D and 3D mesoscale measurements to examine slip transfer through GBs in Ti & Ti-5Al-2.5Sn
Comparing 2D and 3D mesoscale measurements to examine slip transfer through GBs in Ti & Ti-5Al-2.5Sn
Characterizing Glass Fragments Using Micro-XRF Intensity Ratios
Characterizing Glass Fragments Using Micro-XRF Intensity Ratios