Power Semiconductor Rollercoaster: DRB (Dynamic Reverse Bias)

Описание к видео Power Semiconductor Rollercoaster: DRB (Dynamic Reverse Bias)

In this video, Gabriel Lieser, Gabriel Lieser, Head of Power Semiconductor Reliability Research at NI, focuses on DRB tests (Dynamic Reverse Bias). This is a reliability test for wide-bandgap devices made of SiC or GaN.
Learn about the two ways of performing this reliability test for SiC and GaN components and what needs to be considered when setting up and performing the test.

Learn more: https://bit.ly/3XHjZYG

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