NXP & Memfault: Higher Quality, Better Performing IoT Devices with Embedded Observability Webinar

NXP and Memfault have collaborated to give IoT device manufacturers in-field device monitoring, crash reporting, and updating capabilities for faster product development, improved device operation, and reduced direct resource costs.

Together, Memfault and NXP are helping IoT developers build smart cities, smart homes, IIoT, and automotive devices to save time and ease the worry of triaging and troubleshooting, allowing them to focus on building value-added features.

In this webinar you will learn how to:

Gain deep insights into embedded device performance in a cloud-based environment
Access debugging information without requiring any user interaction, device RMAs, or on-site visits
Orchestrate complex OTA updates of firmware in an organized and controlled manner
Get started with a project example using Memfault and NXP i.MX RT1060 MCUs

Get started with Memfault on your NXP-based devices for free: https://app.memfault.com/register-nxp
Integration Guide: https://docs.memfault.com/docs/mcu/ar...

Presentation Details:
Presentation: 0:00 – 49:17
Q&A from live audience: 49:18 - 1:05:53

Download the presentation slides:https://go.memfault.com/hubfs/2022.06....