Скачать или смотреть SEM SU3900: Part 1 Pushing the resolution for high magnification (imaging a difficult sample)

In this session, we walk through how to optimize high-resolution imaging using a scanning electron microscope (SEM), focusing on observing silver film at high magnification. The video includes detailed explanations of sample preparation, microscope setup, detector selection, and imaging parameters to maximize resolution. Ideal for students or researchers learning SEM techniques.
Timestamps:
0:00 – Introduction
Overview of the goal: pushing the SEM’s resolution to observe individual grains in a silver film.
0:31 – Sample Information
Discussion about the conductive nature of the silver sample and implications for using high vacuum mode and secondary electron detectors.
1:43 – Venting the Chamber
Opening the microscope chamber to check if a sample is already loaded.
3:15 – Loading the Sample
Step-by-step sample loading and ensuring the height won’t damage the microscope.
4:59 – File Management
Guidance on where to save image files and choosing the appropriate directory.
6:07 – Detector and Sample Region Details
Setting the secondary electron detector and identifying uniform and clipped regions on the silver film.
7:00 – Optimizing Resolution Settings
Explanation of how accelerating voltage, spot size, aperture size, and working distance affect resolution.
8:44 – Aperture Selection
Demonstration of how to choose the appropriate aperture size and the trade-off between signal strength and resolution.
10:00 – Beam and Image Alignment
Beginning the alignment process, including aperture alignment and stigmator adjustment to refine image clarity.
11:43 – Focusing and Stigmator Use
Live adjustments to stigmators to correct beam shape and sharpen image resolution.
13:38 – Final Tuning
Using slow scan speed and fine-tuning stigmators and alignment for optimal image quality.