Fundamentals of the Pulsed-Laser Technique for Single-Event Effects Testing Dale McMorrow PhD Naval

In this video, Dale McMorrow describes the use of a pulsed laser for studying radiation induced single-event effects in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event upsets in memories.
The presentation describes the laser testing technique, which has developed into a powerful diagnostic tool for investigating and characterizing the details of SEEs in semiconductor devices. It can be considered as a complementary tool to the classical approach, which involves testing with particle accelerators. The first section describes the fundamentals of the laser testing technique. The second section introduces the actual experimental implementations encountered both in the academic and industrial worlds. The last section illustrates the power of the laser method for SEU and SET testing as well as its actual limitations when compared directly to the classical testing with particle accelerators