Скачать или смотреть [22] PIC12F683 part 2: Decapsulation and delayering

In part 2 of the PIC12F683 series, we depackage several components using different techniques to obtain high resolution microscope imagery for use in future parts of the project.

Part 1:    • [21] PIC12F683 part 1: Introduction and pa...  
Part 3:    • [23] PIC12F683 part 3: Risk mitigation, fl...  

00:00 - Introduction
00:13 - Partial decap theory
09:25 - Sample mounting and masking for partial decap
12:34 - Wet bench work for partial decap
19:38 - Microscope study of partial decap sample
28:45 - Wet bench work for bare die decap
33:02 - Deprocessing theory
41:57 - Wet etch montage
42:48 - Concluding remarks

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