Advantages of Leeb and Portable Rockwell hardness testing methods I Webinar

Successful quality control can be achieved in a timely manner by taking advantage of portable testing solutions. Such a drastic reduction of inspection time has a direct impact on costs by avoiding dismantling of test samples, sectioning, or prepping. Adopting these techniques has been proven to reduce testing time significantly and in some cases by more than 80%. The testing principles are relatively easy to adopt and the results have been shown to provide great benefits to the users when compared to traditional methods.

The importance of choosing the correct testing methods

Test principles such as Portable Rockwell and Leeb rebound provide modern, quick, and easy tools that can supplement or potentially replace traditional methods based on lab environments. Regardless of the many guidelines and procedures currently adopted in the industry, hardness testing is not always as straight forward when dealing with non-ideal samples, due to lack of mass, thickness, and other critical geometries. Accuracy and repeatability of the results can vary significantly between each method, therefore selecting the appropriate test principle is a critical factor. In this webinar session, we will cover all the necessary aspects of selecting the appropriate device to suit a wide range of applications in the industry.

The advantages of combined hardness testing methods illustrated on specific applications

Combining Leeb and Portable Rockwell allows the inspection to be carried out on areas that generally lack the necessary geometrical requirements. We will advance further into the combined method of Leeb and Portable Rockwell by highlighting real application examples such as weld inspection where testing is required on the base material, HAZ (Heat Affected Zone), and the weld crown. Additionally, independent guidelines (ASME, Nordtest, DGZfP) and standards (ASTM, ISO, DIN) are covered in order to help utilize the most suitable test method for each specific application.

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