ASIC Interview Questions | Process, Voltage and Temperature (PVT) Corner | On-chip Variations

Описание к видео ASIC Interview Questions | Process, Voltage and Temperature (PVT) Corner | On-chip Variations

• Effect of the process, voltage, temperature changes • CMOS device/circuit performance • PVT corner • PVT corners • Characterization • FF • SS • FS • SF • Static timing analysis (STA) • On-chip variation • ASIC Interview Questions

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