FIB-SEM Based Time of Flight Mass Spectrometry ToF-SIMS

Описание к видео FIB-SEM Based Time of Flight Mass Spectrometry ToF-SIMS

This webinar covers the theory and applications of FIB-SEM based ToF-SIMS. ToF-SIMS is a recently developed technique that provides elemental analyses like EDS and WDS, but goes further and is able to also generate chemical state and molecular information. The system used here is a TESCAN LYRA Ga FIB-SEM.

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