Скачать или смотреть NXP CAMPUS CONNECT_DFT A DEEP DIVE_JULY 04, 2023

Design for Test (DFT) is crucial in semiconductor design, ensuring efficient testing of integrated circuits (ICs). By implementing specific techniques during the design phase, DFT enhances testability, enabling effective fault detection and diagnosis. It plays a vital role in ensuring reliable and high-quality ICs, reducing time-to-market and production costs. Design for Test (DFT) is achieved through techniques like built-in self-test (BIST), scan chains, and boundary scans. These methods enhance testability by incorporating dedicated circuitry and standardized interfaces to facilitate thorough testing and fault identification during manufacturing.

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