How to calculate dislocation density from XRD data using origin

#dislocationdensity #originlab #sayphysics
00:00 what is dislocation density
02:00 estimate the dislocation density from XRD using origin
03:50 strain and dislocation density from XRD data using origin
04:55 dislocation density calculation from XRD data using origin

Exercise File (Origin File):
https://drive.google.com/file/d/1uZ-P...
Excel Template for Calculations:
https://drive.google.com/file/d/1-cs4...

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The dislocation density is a measure of the number of dislocations in a unit volume of a crystalline material i.e. the length of dislocation lines per unit volume of the crystal (m/m3)
Edge dislocation
Screw dislocation
Dislocations distort a crystal lattice, causing elastic stress around the dislocation line, & hence strain energy.
For ultimate strength, dislocations are to be eliminated

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Reference Article:
https://link.springer.com/article/10....
References:
http://prism.mit.edu/xray

Article References
https://link.springer.com/article/10....
D. Balzar, N. Audebrand, M. Daymond, A. Fitch, A. Hewat, J.I. Langford, A. Le Bail, D. Louër, O. Masson, C.N. McCowan, N.C. Popa, P.W. Stephens, B. Toby, “Size-Strain Line-Broadening Analysis of the Ceria Round-Robin Sample”, Journal of Applied Crystallography 37 (2004) 911-924
•S Enzo, G Fagherazzi, A Benedetti, S Polizzi,
–“A Profile-Fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks: I. Methodology,” J. Appl. Cryst. (1988) 21, 536-542.
–“A Profile-Fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks. II. Application and Discussion of the Methodology” J. Appl. Cryst. (1988) 21, 543-549
•B Marinkovic, R de Avillez, A Saavedra, FCR Assunção, “A Comparison between the Warren-Averbach Method and Alternate Methods for X-Ray Diffraction Microstructure Analysis of Polycrystalline Specimens”, Materials Research 4 (2) 71-76, 2001.
•D Lou, N Audebrand, “Profile Fitting and Diffraction Line-Broadening Analysis,” Advances in X-ray Diffraction 41, 1997.
•A Leineweber, EJ Mittemeijer, “Anisotropic microstrain broadening due to compositional inhomogeneities and its parametrisation”, Z. Kristallogr. Suppl. 23 (2006) 117-122
•BR York, “New X-ray Diffraction Line Profile Function Based on Crystallite Size and Strain Distributions Determined from Mean Field Theory and Statistical Mechanics”, Advances in X-ray Diffraction 41, 1997.

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