2DCC-MIP Webinars Oct 2017 Atomic Force Scanning Tunneling Microscopy

Описание к видео 2DCC-MIP Webinars Oct 2017 Atomic Force Scanning Tunneling Microscopy

In this talk I will introduce a variety of atomic force (AFM) and scanning tunneling microscopy (STM) measurement techniques for atomic scale investigations of the structural and electronic properties of materials, with examples drawn primarily from investigations of 2D material systems.

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