LINSEIS Thin Film Thermal Conductivity - Product presentation

Linseis offers a very comprehensive product lineup for the measurement of the thermal and electrical transport properties of thin films from the nanometer (nm ) to the micrometer (µm) in a temperature range from liquid nitrogen (-196°C) up to temperatures of +2800°C.

The TFA operates in agreement with national and international standards such as ASTM F76 – 08 (Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors).


The Linseis TFA:

The TFA – Thin Film Analyzer, which is a unique, chip-based platform to simultaneously measure the in-plane electrical and thermal conductivity, the Seebeck coefficient as well as the Hall constant of a thin film
sample in the temperature range from -170°C up to 280°C and in a magnetic field of up to 1 T.


The Linseis TF-LfA:
The TF-LFA, which is an advanced version of the standard LaserFlash, which measures the thermal diffusivity of materials using a pump-probe setup (TDTR – Time-domain thermoreflectance). This optical measurement technique allows the characterization of nm to µm thin films and coatings as well as the characterization of high conductive bulk materials.



More information: https://www.linseis.com/en/products/t...
You need measurements for your lab?
Please contact our service lab for a quotation: https://www.linseis.com/en/service-lab/
Or have a look at our applications: https://www.linseis.com/en/applications/
Download Thermal Analysis poster here: https://www.linseis.com/en/service-su...