Break through yield barriers with Siemens and PDF solutions

Описание к видео Break through yield barriers with Siemens and PDF solutions

Presentation by PDF Solutions recorded at U2U North America 2023.

Presented by THOMAS ZANON
Engagement Director | PDF Solutions

Thomas Zanon is an Engagement Director at PDF Solutions with 17 years of experience in the semiconductor business and currently a technical lead in the Siemens - PDF Solutions collaboration. Thomas held multiple roles at PDF Solutions in development of the Bitmap solution, Design-for-Inspection (DFI) and yield ramp consulting projects. Thomas has a Dipl. Ing. in EE & IT from the Technical University in Munich and a Ph.D. in EE from Carnegie Mellon University in Pittsburgh, PA.

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ABOUT TESSENT SILICON LIFEYCYCLE SOLUTIONS

Tessent Silicon Lifecycle Solutions (formerly Mentor Graphics/UltraSoc) is a division of Siemens EDA (Siemens Digital Industries Software).

Tessent are widely recognized as the industry market leader in delivering design augmentation and linked applications that detect, mitigate and eliminate risks throughout the IC lifecycle. Tessent solutions help customers address their debug, test, yield, safety, security and optimization requirements for today’s most complex SoCs.

Tessent solutions fall into 2 key categories, Tessent Test and Tessent Embedded Analytics.

TESSENT TEST | Design for Test (DFT) and Yield Learning
DFT and yield learning products for logic, memory and mixed-signal devices.
The Tessent Test product suite provides comprehensive silicon test and yield learning applications that addresses the challenges of manufacturing test, debug, and yield ramp.

TESSENT EMBEDDED ANALYTICS | SoC Debug and Analytics
Tessent Embedded Analytics provides solutions for real-time debug and post-deployment analytics for RISC-V-based and other complex SoCs.

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LEARN MORE
Visit the Tessent website: www. https://eda.sw.siemens.com/en-US/ic/t...
Email: [email protected]

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