Introducing Tektronix's Advanced Double Pulse Testing System

Описание к видео Introducing Tektronix's Advanced Double Pulse Testing System

In this video, John Tucker from Tektronix presents their advanced Double Pulse Testing System, crucial for identifying RDS(on) in silicon carbide and gallium nitride devices. Featuring MSO 5 Series oscilloscopes, function generators, and Keithley units, this system ensures precise measurements and reliable performance validation for cutting-edge semiconductor technologies.

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