AFM | High Resolution Quantitative Kelvin Probe Force Microscopy: Principles & Applications | Bruker

Описание к видео AFM | High Resolution Quantitative Kelvin Probe Force Microscopy: Principles & Applications | Bruker

In our new probe and instrument designs, we have found ways to reduce probe to probe measurement scatter to below a standard deviation of 50 mV. This represents a major advance towards quantitative work function measurement, which in turn expands KPFMs utility in ever demanding applications.
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