Скачать или смотреть Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE EV

The Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE EV utilizes the sola slit to direct the X-ray beam, which then irradiates the sample through a divergent slit. The sample stage is positioned at the center of the goniometer, operating on the reflection geometry θs-θd. When the X-ray beam meets Bragg's law, diffraction occurs in a specific direction. The diffracted beam passes through anti-scatter, Sora, and receive slits before reaching the X-ray detector. Finally, the acquired diffraction map is displayed through the data processing system in the analysis software.

Benchtop XRD Analyzer – X-ray Diffractometer – FRINGE EV is a high-power, miniaturized benchtop X-ray diffractometer developed independently by the company. It enables quick characterization of sample phases in powder, block, or thin film forms, as well as crystal structure analysis, material structure analysis, and crystallinity determination. With its user-friendly operation, high precision, stability, and wide applicability, it serves as an ideal solution for material research, universities, research institutes, building materials, biomedicine, and various other fields.

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