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DIMPLE GRINDER TEM-DG-200
A mechanical thinning instrument, designed for the reproducible preparation of high- quality electron microscopy specimen, greatly reducing ion milling times, uneven thinning, surface defects & irradiation damage.

Specimen Preparation:
The Mascotek Scientific Model TEM-DG-200 Dimple Grinder will reduce, with minimal damage, the central region of a typical 100 µm thick, 3 mm diameter specimen blank to a few microns in times ranging from 10 minutes for Aluminum to 20 minutes for silicon to 100 minutes for sapphire and then finally polish the specimen to near electron transparency. It will monitor & display the dimpling parameters to enable termination once the set time for specimen thinning is reached.

Specimen Positioning:
Prior to grinding, specimen are attached using a low melting point thermoplastic polymer to the top of the platen. The platen fits into a magnetic base, which is coupled to the specimen stage by a rare-earth magnet. This magnetic coupling allows the base to be positioned so that a particular area of the specimen can be precisely placed under the grinding wheel. Positioning can be observed through a 45X optical microscope. The specimen can be readily removed for inspection and then precisely repositioned for continued grinding. Specimen rotation speed is continuously varied by a front panel mounted potentiometer. The specimen surface is exceptionally smooth and polished. This reduces the probability of surface irregularities developing in the brief final thinning operation and increases the yield of electron transparent material.