Next generation optical surface profiling | TopMap Micro.View® & Micro.View®+

For 3D surface characterization regarding surface roughness, texture and areal evaluation of form parameters with a resolution down to the nanometer range, use the TopMap whitelight-interferometers Micro.View and Micro.View+.
The optical profilers with microscope objectives feature the CST Continuous Scanning Technology allowing to use the entire z travel range as measuring range, leading to maximum flexibility in sample positioning. Focus Finder and Focus Tracker enhance the ease of use, and with motorized stages, samples stay focused at all times. The inherent Smart Scanning Technology enables areal topography measurement from all surfaces, even on dark and shiny materials.
Choose add-ons like ECT Environmental Technology Compensation for measuring in challenging production environments and extract both surface and color information for superior defect detection and documentation of precision mechanics and electronics.
Choose your own configuration within the modular concept of the Micro.View surface profiler and stay up to date with 4 years warranty and a lifetime software support. TopMap - Performance beyond metrology.

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More information: https://www.polytec.com/int/surface-m...