Gallium Nitride Reliability in Real-World Solar Applications Webinar.

Using Test-to-Fail Methodology to Accurately Predict How eGaN® Devices Can Last More Than 35 Years in Solar Applications.

Modern solar panels are demanding increasingly higher power density and longer operating lifetimes. Solar applications including power optimizers and panels with built-in microinverter are becoming the prevailing trend for an increasing number of solar customers. Gallium nitride (GaN) power transistors and integrated circuits offer solutions that can make solar power systems smaller, cooler, more efficient, and more reliable.

Greater than 25 years of reliable operation is a typical requirement for solar installations, so in this webinar we will delve into the pioneering approach of utilizing Test-to-Fail methodology to accurately predict the lifespan of eGaN devices, which have demonstrated their potential to surpass the 35-year mark in solar applications.

Watch the video replay of this webinar to learn more about:

Introduction to GaN technology and its benefits in solar applications.

Understanding the Test-to-Fail methodology and its relevance in predicting device reliability.

The application of the test-to-fail methodology to accurately predict the exceptional longevity of eGaN devices in solar applications.

Q&A session to address specific queries and concerns.

By watching the replay of this webinar, you will gain invaluable insights into the reliability of Gallium Nitride technology, particularly in solar applications. You will also have the opportunity to see how attendees of the live webinar interact with our expert speaker and have their questions answered directly. This webinar will provide you with actionable knowledge that can help enhance your projects and decision-making processes for solar applications.