Скачать или смотреть [Electronics] Multiple cross-section preparation by BIB (Broad Ion Beam) milling

Multiple cross sections were prepared by Broad Ion Beam milling system using “Milling Process Creator”, new function to allow high-throughput sequential processing under optimum conditions. 3 target regions were automatically processed at different accelerating voltages (7 kV, 6 kV, 8 kV and 2 kV) avoiding heat damage and ion damage in a much shorter time than processing whole area.
#CircuitBoard #CrossSection #ElectronMicroscopy #ElectronMicroscope #SEM #BIB #BroadIonBeam

Available tools for this measurement are :
BIB system
https://www.hitachi-hightech.com/glob...
SEM
https://www.hitachi-hightech.com/glob...

Further details can be found on our membership website with data library. Looking forward to your joining.
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About our membership site, see https://www.hitachi-hightech.com/glob...