Скачать или смотреть nanoHUB-U Fundamentals of AFM L1.3: Point Mass Model - Frequency Response

Table of Contents:
00:09 Lecture 1.3: Point Mass Oscillators: Frequency Response
00:14 From the last lecture
03:36 Response of directly excited AFM levers
09:09 Response of directly excited AFM levers
14:25 Response of acoustically excited levers
16:57 Response of acoustically excited levers
21:00 How to tell if your system measures phase lead or phase lag?

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. (https://nanohub.org/courses/AFM2)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.