Linseis Thermoelectric devices - Basics

Thermoelectricity describes the mutual influence of temperature and electricity in a material and is based on three basic effects: the Seebeck-effect, the Peltier-effect and the Thomson-effect.
In our webinar we show you the instruments for the determination of electrical properties.

Linseis TEG Tester is a measurement system for temperature dependent conversion efficiency evaluations for thermoelectric generators (TEGs).

Most advanced Seebeck Coefficient and Electric Resistivity (LSR) characterization of Bulk material and Thin-Films with the LSR-3 or LSR-4.

LZT-Meter: Combined LFA (Thermal Conductivity/Diffusivity) + LSR (Seebeck Effect and Electric Resistivity) for a complete ZT-Characterization.

The HCS System permits the characterization of semiconductor devices, it measures: mobility, resistivity, charge carrier concentration and Hall coefficient.

TFA – Thin Film Analyzer – Latest generation Lab-on-a-Chip technique with complete figure of merit ZT-Characterization of Thin-Films from the nm to µm range from -170°C up to 280°C.

Interested in measurements as a service?
Please contact our service lab for a quotation: https://www.linseis.com/en/service-lab/
Or have a look at our applications: https://www.linseis.com/en/applications/
Download Thermal Analysis poster here: https://www.linseis.com/en/service-su...