Instrumental Resolution File (IRF) for Rietveld Refinement Using FullProf Package

Описание к видео Instrumental Resolution File (IRF) for Rietveld Refinement Using FullProf Package

‪@physicsdoneright‬ This file is required to study the microstructural properties of the materials using FullProf package. The steps are mentioned in video.

1. Collect the XRD data for LaB6 or Si standards in the same diffractometer where you have collected the XRD data for the sample to be refined using the Full Prof Package.
2. Fit each peak using a Voigt Function and find the peak position, FWHM of Gaussian (HG) and Lorentzian Contribution (HL).
3. Save the file in notepad with .irf extension file format = 4.
4. Import to Rietveld to study microstructural properties of the sample.

Check the link: https://doi.org/10.1016/j.matchemphys...

Комментарии

Информация по комментариям в разработке